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36 - 40 uur | Delft Challenge: Developing and operationalizing value-based assessment methods for AI systems.Change: Driving validation of AI systems to ensure that only trustworthy models are used.Impact: Enhancing police trustworthiness through ...
Job descriptionThis project aims at effective up- and reskilling of heat pump installers through the development of a technology-enhanced workplace learning curriculum. The ideal candidate should ...
Job descriptionThis PhD project is part of the ERC Consolidator Grant project WINDFLOW, which strives to develop groundbreaking large-eddy simulation strategies for wind farm flows. Joining our tea...
Position PhD-studentIrène Curie Fellowship NoDepartment(s) Electrical EngineeringFTE 1,0Date off 01/09/2024Reference number V36.7646Job descriptionResearch Programme Description“E2GO– Cost-reduction of EV fast-charging station to enable large-scal...
Position PhD-studentIrène Curie Fellowship NoDepartment(s) Mathematics and Computer ScienceFTE 1,0Date off 23/09/2024Reference number V32.7703Job descriptionWe are seeking to fill a PhD position in the Data and Artificial Intelligence Cluster, wit...
Are you eager to work on a combination of Large Language Models (LLMs) with Knowledge Graphs (KGs) to create trustworthy conversational AI? Do you want to have an impact on the world’s supplier to the semiconductor industry (ASML)?Position PhD-stu...
Job descriptionThis PhD project is part of the ERC Consolidator Grant project WINDFLOW, which strives to develop groundbreaking large-eddy simulation strategies for wind farm flows. Your research w...
Work Activities This fully funded PhD position is part of a Holland High Tech (TKI HTSM) grant titled “Imaging Spectroscopy for Broadband EUV Source Size Characterization (ImSpec)”, a collaboration...
Work Activities Optical metrology is a key ingredient of nanolithography, as it enables the characterization of critical features of nanostructures printed on wafers. High-resolution imaging is an ...
Work ActivitiesOptical metrology is a key ingredient of nanolithography, as it enables the characterization of critical features of nanostructures printed on wafers. High-resolution imaging is an essential part of optical metrology: We need to per...